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Welcome to the Laboratory of Electron Microscopy and Material Advances (LEMMA)

Published on 21 February 2024
Head of LEMMA

Thierry DEUTSCH (interim)
Advanced Electron Microscopy (LEMMA)
CEA-Grenoble
17 avenue des Martyrs
38 054 Grenoble cedex 9
Phone: 04 38 78 20 73
Fax: 04 38 78 58 17


Members of LEMMA
Permanent staff
Denis JALABERT
Pierre-Henri JOUNEAU
Bérangère MOREAU
Hanako OKUNO
Éric ROBIN
Jean-Luc Rouvière (Biography - email)
Nicola VIGANO

Non-Permanent staff
Arawinth Alexander CAMATCHY
Djordje DOSENOVIC
David LANDERS
Antonin LOUISET
My-Nhat Anh QUACH
Claire SEYDOUX


Presentation
The LEMMA is dedicated to the study of the properties and the structures of materials on an atom scale by developping new methods around ionic and electronic microscopy. The spectrum of studied materials is wide, going from biological cells to nano objects, 2D materials and nanomagnetism.

The implemented studies are either carried by permanent members of the laboratory, or carried through local, national or international collaborations. The LEMMA takes part in the PFNC’s life (Plateforme de Nano-Caractérisaion), that brings together the expertise of the Liten and Leti in microscopy to Minatec in the CEA Grenoble.

Each laboratory member carries their own research and act collectively to train internal and external users (though the METSA network in particular in which the LEMMA is invested) in electronic or ionic microscopy, LEMMA’s PhD Students, interns and postdoc supervision, maintenance of the instrumental equipment, share of research papers and the interaction with other microscopy platforms of Grenoble (IBS, Institut Néel,…)

The expertise of the laboratory members covers tomography though ionic microscopy, corrected high resolution (TEM & STEM), physical properties mapping with 4D-STEM, electronic ptychography and holography, EXD and EELS chemical analysis. All of those techniques are implemented and developed with and quantitative approach, though in-situ methods (temperature, current injection, applying electromagnetic fields) and the developments made around image processing (segmentation, reconstruction, spectroscopy).