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Communications à congrès de l'équipe en 2016

Publié le 21 novembre 2018

Investigating the Nucleation and Growth of Quaternary Cu2ZnSnS4 Nanocrystals
Agnese F, Lefrançois A, Pouget S, Vaure L, Makrygenni O, Chandezon F, Bayle-Guillemaud P, Okuno H, Reiss P and Rouviere J-L
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/investigating-the-nucleation-and-growth-of-quaternary-cu2znsns4-nanocrystals/

3D chamical analyses of nitride heterostructures using APT and TEM + EDX
Amichi L
Comm. Poster: Réunion annuelle du Labex GANEX (Montpellier, France, January 25-28, 2016)

Mesure de dopants par sonde atomique tomographique
Amichi L
Comm. Orale: Journée Thématique Microscopie du Labex GANEX (Grenoble, France, March 22, 2016)

Quantifying Mg dopant in GaN and AlGaN nanostructures
Amichi L, Mouton I, Cooper D, Robin E, Delaye V, Mollard N, Vennéguès P, Matta S, Brault J, Grenier A, et al.
Comm. Poster: 16th European Microscopy Congress EMC2016 (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/quantifying-mg-doping-in-algan-layers/

Potential exchange between anions (Se, Te) or cations (Cd, Zn, Mn) at the surface of II-VI layers
André R, Bonef B, Bougerol C, Mariette H, Grenier A, Den Hertog M, Jouneau P-H and Bellet-Amalric E
Comm. Poster: 19th International Conference on Molecular-Beam Epitaxy MBE2016 (Montpellier, France, September 4-9, 2016)

Probing the degradation mechanisms of silicon anodes in Li-ion batteries by STEM-EELS mapping
Boniface M, Danet J, Quazuguel L, Moreau P, Boucher F, Bayle-Guillemaud P and Guyomard D
Comm. Poster: International Battery Association meeting (Nantes, France, March 20-25, 2016)

Low-loss STEM-EELS analysis of beam-sensitive lithium-ion negative electrodes
Boniface M, Quazuguel L, Moreau P, Boucher F, Guyomard D and Bayle-Guillemaud P
Comm. Orale: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/low-loss-stem-eels-analysis-of-beam-sensitive-lithium-ion-negative-electrodes/

Low-loss STEM-EELS analysis of beam-sensitive lithium-ion negative electrodes
Boniface M, Quazuguel L, Moreau P, Boucher F, Guyomard D and Bayle-Guillemaud P
Comm. Orale: 10ème édition des Journées de l'EELS - JEELS 2016 (Tarragona, Spain, June 28-30, 2016)

Mapping electrostatic potentials and deformation in semiconductor devices by off-axis electron holography and other techniques
Boureau V, Cooper D, Bernier N and Rouviere J-L
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/mapping-electrostatic-potentials-and-deformation-in-semiconductor-devices-by-off-axis-electron-holography-and-other-techniques/

Engineering Phonon Thermal Transport by Nanostructuration : From Fundamentals to Applications
Bourgeois O, Tainoff D, Tavakoli A, Liu Y, Boukhari M, Paterson J, Barski A, Bayle-Guillemaud P, Hadji E, Gomes S, et al.
Comm. Orale: 15èmes Journées de la Matière Condensée JMC15 (Bordeaux, France, August 22-26, 2016)

Deformation mapping in a TEM: Dark Field Electron Holography, Nanobeam Electron Diffraction, Precession Electron Diffraction and GPA compared
Cooper D, Bernier N and Rouviere J-L
Comm. Orale: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/deformation-mapping-in-a-tem-dark-field-electron-holography-nanobeam-electron-diffraction-precession-electron-diffraction-and-gpa-compared/

Si Anode Diagnostic and Failure Mechanism in Full Li-Ion Cells Using NMR, STEM-EELS, XPS and FIB-TOF-SIMS Advanced Characterization Tools
Dupré N, Guyomard D, Moreau P, De Vito E, Quazuguel L, Boniface M, Lestriez B, Bordes A, Rieutord F, Lyonnard S, et al.
Comm. Invitée: 18th International Meeting on Lithium Batteries IMLB (Chicago, IL, June 19-24, 2016)
http://ma.ecsdl.org/content/MA2016-03/1/13.abstract

Analytical multi-probe study of the SEI on silicon based electrode in full cell configuration
Dupré N, Moreau P, De Vito E, Quazuguel L, Boniface M, Bordes A, Rudisch C, Bayle-Guillemaud P and Guyomard D
Comm. Invitée: International Battery Assocciation meeting (Nantes, France, March 20-25, 2016)

In-situ propagation of Al in germanium nanowires observed by transmission electron microscopy
El Hajraoui K, Robin E, Lopez-Haro M, Zeiner C, Brunbauer F, Kral S, Lugstein A, Rouvière J-L and Hertog MD
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/in-situ-propagation-of-al-in-germanium-nanowires-observed-by-transmission-electron-microscopy/

Bottom-up Silicon Nanostructures: A Toolbox for Integrated on-Chip EDLCs
Gaboriau D, Brachet M, Boniface M, Aradilla D, Aldakov D, Bidan G, Le Bideau J, Brousse T, Gentile P and Sadki S
Comm. Orale: 230th ECS Meeting (Honolulu, HI, October 2-7, 2016)
http://ma.ecsdl.org/content/MA2016-02/7/957.abstract

Structure and Dopant Engineering in PEDOT Thin Films: Practical Tools for a Dramatic Conductivity Enhancement
Gueye MN, Carella A, Massonnet N, Yvenou E, Brenet S, Faure-Vincent J, Pouget S, Rieutord F, Okuno H, Benayad A, et al.
Comm. Orale: E-MRS Fall Meeting Symposium E: Organized nanostructures and nano-objects: fabrication characterization and applications (Warsaw, Poland, September 19-22, 2016)
http://www.european-mrs.com/organized-nanostructures-and-nano-objects-fabrication-characterization-and-applications-emrs#collapse49

Failure mechanism of Si electrode in Li-ion cells
Guyomard D, Dupré N, Moreau P, Quazuguel L, De Vito E, Boniface M, Lestriez B, Bordes A, Rieutord F, Danet J, et al.
Comm. Invitée: 9th International Conference on Advanced lithium Batteries for Automotive Applications ABAA9 (Zhejiang, China, October 17-20, 2016)

(Battery Division Technology Award) Some Directions for Performance Improvement of Li-Ion Batteries out of Usual Paths
Guyomard D, Gaubicher J, Jimenez-Manero P, Quazuguel L, Dupre N, Moreau P, Lestriez B, Blanchard P, Cougnon C, Levillain E, et al.
Comm. Invitée: 230th ECS Meeting - PRiME (Honolulu, Hawaii, October 2 - 7, 2016)
http://ma.ecsdl.org/content/MA2016-02/3/272.abstract

Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.
Haas B, Cooper D and Rouviere J-L
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/direct-comparison-of-differential-phase-contrast-and-off-axis-electron-holography-for-the-measurement-of-electric-potentials-by-the-examination-of-reverse-biased-si-p-n-junctions-and-iii-v-samples-2/

Picometre-precision atomic structure of inversion domain boundaries in GaN
Haas B, McLeod RA, Auzelle T, Daudin B, Eymery J, Lançon F, Zuo J-M and Rouvière J-L
Comm. Orale: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/picometre-precision-atomic-structure-of-inversion-domain-boundaries-in-gan/

Zorro: multi-reference dose-fractionated image registration
McLeod R, Haas B and Stahlberg H
Comm. Orale: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/zorro-multi-reference-dose-fractionated-image-registration/

SEI characterization and failure mechanism of Si electrodes in full Li-ion cells
Moreau P, Dupré N, De Vito E, Quazuguel L, Boniface M, Bordes A, Rudisch C, Bayle-Guillemaud P and Guyomard D
Comm. Orale: Energy Materials Nanotechnology Meeting on Battery Technology (Orlando, FL, February 20-25, 2016)

Van der Waals heterostructures of MoSe2 and graphene studied by transmission electron microscopy
Okuno H, Minh TD, Robin E, Marty A, Le Poche H, Pochet P and Jamet M
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/van-der-waals-heterostructures-of-mose2-and-graphene-studied-by-transmission-electron-microscopy/

Control of the incubation time of ZnTe NWs by Au dewetting under Zn flux
Orrù M, Rueda-Fonseca P, Artioli A, Jeannin M, Bellet-Amalric E, den Hertog M, Robin E, Genuist Y, André R, Tatarenko S, et al.
Comm. Orale: Atelier Nanofils Semiconducteurs (Meudon, France, June 20-22, 2016)

Control of the incubation time in the VSS growth of nanowires
Orrù M, Rueda-Fonseca P, Artioli A, Jeannin M, Bellet-Amalric E, den Hertog M, Robin E, Genuist Y, André R, Tatarenko S, et al.
Comm. Orale: 19th International Conference on Molecular-Beam Epitaxy MBE2016 (Montpellier, France, September 4-9, 2016)

Spin pumping and spin-orbit effects in Ge
Oyarzún S, Nandy AK, Rortais F, Rojas-Sánchez J-C, Laczkowski P, Pouget S, Okuno H, Vila L, Vergnaud C, Beigné C, et al.
Comm. Invitée: SPIE Optics + Photonics 2016: Spintronics IX (San Diego, CA, August 28–September 1, 2016)

Core-shell structural evolution of crystalline silicon nanoparticles upon lithiation/delithiation by ex situ Raman spectroscopy and operando synchrotron X-ray diffraction
Pavlenko E, Quazuguel L, Boniface M, Tardif S, Rieutord F, Marechal M, Micha J-S, Mareau VH, Gonon L and Lyonnard S
Comm. Orale: 229th ECS Meeting - Future and Present Advanced Lithium Batteries and Beyond – a Symposium in the Honor of Prof. Bruno Scrosati (San Diego, CA, May 29-June 2, 2016)
https://ecs.confex.com/ecs/229/webprogram/Paper73106.html

Evolution of the silicon-based anode upon cycling probed by operando synchrotron reflectivity and X-ray diffraction combined with ex situ Raman spectroscopy
Pavlenko E, Quazuguel L, Boniface M, Tardif S, Rieutord F, Marechal M, Micha J-S, Mareau VH, Gonon L and Lyonnard S
Comm. Orale: Interfaces SWoCLB (Orlando, FL, May 27, 2016)

Evolution of Nano-Crystalline Silicon Anode upon Cycling Probed By Ex Situ Raman Spectroscopy and Operando Synchrotron X-Ray Diffraction
Pavlenko E, Quazuguel L, Boniface M, Tardif S, Rieutord F, Marechal M, Micha J-S, Mareau VH, Gonon L and Lyonnard S
Comm. Poster: 18th International Meeting on Lithium Batteries IMLB (Chicago, IL, June 19-24, 2016)

3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography
Printemps T, Bernier N, Robin E, Saghi Z and Hervé L
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/stem-study-of-the-influence-of-synthesis-conditions-on-the-nanostructure-and-performance-of-auceo2-model-catalysts/

SEI characterization and failure mechanism of Si electrodes in full Li-ion cells
Quazuguel L, Dupré N, Moreau P, Rudisch C, Danet J, Boniface M, De Vito E, Lyonnard S, Bayle-Guillemaud P and Guyomard D
Comm. Poster: International Battery Assocciation meeting (Nantes, France, March 20-25, 2016)

Discrete STEM/EDX tomography for quantitative 3D reconstructions of chemical nanostructures
Robin E, Lopez-Haro M, Mollard N, Rueda-Fonseca P, Orru M, Bellet-Amalric E, Genuist Y, Andre R, Artioli A, Tatarenko S, et al.
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/discrete-stemedx-tomography-for-quantitative-3d-reconstructions-of-chemical-nanostructures/

[33] Quantification of dopants in nanomaterial by SEM/EDS
Robin E, Mollard N, Guilloy K, Pauc N, Gentile P, Fang Z, Daudin B, Amichi L, Jouneau P-H, Bougerol C, et al.
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/quantification-of-dopants-in-nanomaterial-by-semeds/

[34] Spin injection in silicon and germanium: direct comparison between 4 and 3 terminal measurements
Rortais F, Oyarzún S, Bottegoni F, Rojas-Sánchez J-C, Laczkowski P, Ferrari A, Vergnaud C, Ducruet C, Okuno H, Beigné C, et al.
Comm. Orale: 8th Joint European Magnetic Symposia JEMS (Glasgow, UK, August 22-26, 2016)

[35] Measuring Strain at the Nanoscale with High Precision Using Nanobeam Precession Electron Diffraction
Rouviere J-L, Bernier N, Cooper D and Mante N
Comm. Orale: MRS 2016 Spring Meeting Symposium MD2—Tuning Properties by Elastic Strain Engineering—From Modeling to Making and Measuring (Phoenix, AZ, March 28-April 1, 2016)

[36] High-resolution characterization of HgTe/CdTe topological interfaces
Thomas C, Haas B, Jouneau P-H, Meunier T and Ballet P
Comm. Poster: 19th International Conference on Molecular-Beam Epitaxy MBE2016 (Montpellier, France, September 4-9, 2016)

[37] (S)TEM Study of the Influence of Synthesis conditions on the Nanostructure and Performance of Au/CeO2 Model Catalysts
Tinoco M, Fernandez-Garcia S, Lopez-Haro M, Hungria AB, Chen X, Blanco G, Perez-Omil JA, Collins S, Okuno H and Calvino JJ
Comm. Poster: 16th European Microscopy Congress EMC (Lyon, France, August 28-September 2, 2016)
http://emc-proceedings.com/abstract/stem-study-of-the-influence-of-synthesis-conditions-on-the-nanostructure-and-performance-of-auceo2-model-catalysts/