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Proceedings 2017

Publié le 19 novembre 2018

Effect of Thermal and Mechanical Loadings on the Residual Stress Field in a Nickel Based Superalloy using X-Ray Laue Microdiffraction
Altinkurt G, Fevre M, Geandier G, Robach O, Guernaoui S and Dehmas M
Proceedings of the 10th International Conference on Residual Stresses ICRS-10, 2 (2017) 527-532
http://dx.doi.org/10.21741/9781945291173-89

Graphene structuration by self-assembly of high-chi block copolymers
Arias-Zapata J, Ferrah D, Garnier J, Bohme S, Mouray O, Okuno H, Cunge G and Zelsmann M
Materials Today-Proceedings 4 (2017) 6827-6834
http://dx.doi.org/10.1016/j.matpr.2017.07.010

Cavity mode analysis of highly strained direct bandgap germanium micro-bridge cavities
Armand-Pilon F, Zabel T, Marin E, Bonzon C, Tardif S, Gassenq A, Pauc N, Reboud V, Calvo V, Hartmann JM, et al.
Proceedings of the 14th International Conference on Group IV Photonics GFP (2017) 17-18
http://dx.doi.org/10.1109/GROUP4.2017.8082174

X-Ray Reflectivity analysis of SiO2 nanochannels filled with water and ions: a new method for the determination of the spatial distribution of ions inside confined media
Baum M, Rébiscoul D, Tardif S, Tas N, Mercury L and Rieutord F
Procedia Earth and Planetary Science 17 (2017) 682-685
http://dx.doi.org/10.1016/j.proeps.2016.12.146

Passive photonic components and germanium contacts for a 200mm germanium-on-insulator photonic platform
Bertrand M, Gassenq A, Guilloy K, Pauc N, Widiez J, Hartmann J-M, Fowler D, Zabel T, Sigg HC, Faist J, et al.
Proceedings of SPIE 10108 (2017) 1010818
http://dx.doi.org/10.1117/12.2252404

Ultra-Low Temperature Nuclear Magnetic Resonance
Bouleau E, Lee D, Saint-Bonnet P, Hediger S and De Paepe G
IOP Conference Series: Materials Science and Engineering 171 (2017) 012142
http://dx.doi.org/10.1088/1757-899X/171/1/012142

Organization and magnetic properties of FePt nanoparticles on moiré pattern
Capiod P, Tournus F, Bardotti L, Renaud G and Dupuis V
Proceedings of the IEEE International Magnetics Conference INTERMAG Europe (2017)
http://dx.doi.org/10.1109/INTMAG.2017.8007884

Influence of Mineral Salts Content on Bituminous Waste Products Water Uptake
Champenois JB, Blinder R, Guillermo A, Bardet M and Poulesquen A
Proceedings of the 6th Biot Conference on Poromechanics (2017) 634-639
http://dx.doi.org/10.1061/9780784480779.078

Benefits of XPS nanocharacterization for process development and industrial control of thin SiGe channel layers in advanced CMOS technologies
Fauquier L, Pelissier B, Jalabert D, Pierre F, Hartmann J-M, Roze F, Doloy D, Le Cunff D, Beitia C and Baron T
Materials Science in Semiconductor Processing 70 (2017) 105-110
http://dx.doi.org/10.1016/j.mssp.2016.10.028

Low temperature direct bonding comparison
Fournel F, Larrey V, Morales C, Bridoux C, Moriceau H and Rieutord F
Proceedings of the 5th International Workshop on Low Temperature Bonding for 3d Integration LTB-3D (2017) 20
https://doi.org/10.23919/LTB-3D.2017.7947416

High-quality and homogeneous 200-mm GeOI wafers processed for high strain induction in Ge
Gassenq A, Tardif S, Guilloy K, Pauc N, Bertrand M, Rouchon D, Hartmann J-M, Widiez J, Rothman J, Niquet Y-M, et al.
Proceedings of SPIE 10108 (2017) 101081b
http://dx.doi.org/10.1117/12.2251790

Flexible light emitting diodes based on nitride nanowires
Guan N, Dai X, Messanvi A, Zhang H, Yan J, Gautier E, Bougerol C, Vallo M, Julien FH, Durand C, et al.
OSA Technical Digest Part F41-CLEO_SI 2017 (2017) STh3I.1
http://dx.doi.org/10.1364/CLEO_SI.2017.STh3I.1

Capping stability of Mg-implanted GaN layers grown on silicon
Lardeau-Falcy A, Coig M, Charles M, Licitra C, Baines Y, Eymery J and Mazen F
Physica Status Solidi a-Applications and Materials Science 214 (2017) 1600487
http://dx.doi.org/10.1002/pssa.201600487

The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulations
Lee J, Berrada S, Liang J, Sadi T, Georgiev VP, Todri-Sanial A, Kalita D, Ramos R, Okuno H, Dijon J, et al.
Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices SISPAD 2017-September (2017) 157-160
http://dx.doi.org/10.23919/SISPAD.2017.8085288

SiGe bandgap tuning for high speed earn
Mastronardi L, Banakar M, Khokhar AZ, Dominguez Bucio T, Littlejohns CG, Bernier N, Robin E, Rouvière J-L, Dansas H, Gambacorti N, et al.
ECS Transactions 77 (2017) 59-63
http://dx.doi.org/10.1149/07706.0059ecst

Irreversible Capacity Loss of Li-Ion Batteries Cycled at Low Temperature Due to an Untypical Layer Hindering Li Diffusion into Graphite Electrode
Matadi BP, Genies S, Delaille A, Chabrol C, de Vito E, Bardet M, Martin J-F, Daniel L and Bultel Y
Journal of the Electrochemical Society 64 (2017) A2374-A2389
http://dx.doi.org/10.1149/2.0491712jes
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Effects of biphenyl polymerization on lithium deposition in commercial graphite/NMC lithium-ion pouch-cells during calendar aging at high temperature
Matadi BP, Geniès S, Delaille A, Waldmann T, Kasper M, Wohlfahrt-Mehrens M, Aguesse F, Bekaert E, Jiménez-Gordon I, Daniel L, et al.
Journal of the Electrochemical Society 164 (2017) A1089-A1097
http://dx.doi.org/10.1149/2.0631706jes
HAL <hal-01629458>

Inductively Coupled Plasma etching of Germanium Tin for the fabrication of photonic components
Milord L, Aubin J, Gassenq A, Tardif S, Guilloy K, Pauc N, Rothman J, Chelnokov A, Hartmann J-M, Calvo V, et al.
Proceedings of SPIE 10108 (2017) 101080c
http://dx.doi.org/10.1117/12.2252280

Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
Tran Thi TN, Morse J, Caliste D, Fernandez B, Eon D, Hartwig J, Barbay C, Mer-Calfati C, Tranchant N, Arnault JC, et al.
Journal of Applied Crystallography 50 (2017) 561-569
http://dx.doi.org/10.1107/s1600576717003831
HAL <hal-01691844>

Micro-diffraction Investigation of Localized Strain in Mesa-etched HgCdTe Photodiodes
Tuaz A, Ballet P, Biquard X and Rieutord F
Journal of Electronic Materials 46 (2017) 5442-5447
http://dx.doi.org/10.1007/s11664-017-5691-6

3D Characterization of Silicon Based Electrode Material for Advanced Lithium-Ion Storage Technologies
Vorauer T, Rose J, Jouneau PH, Bayle-Guillemaud P, Fuchsbichler B, Koller S and Brunner R
Microscopy and Microanalysis 23 (2017) 2026-2027
http://dx.doi.org/10.1017/S1431927617010790