Elastic relaxation in patterned and implanted strained silicon on insulator
Baudot S, Andrieu F, Rieutord F, Eymery J
Journal of Applied Physics 105 (2009) 114302
http://dx.doi.org/10.1063/1.3137200
Extended x-ray absorption fine structure study of arsenic in HgCdTe: p-type doping linked to nonsubstitutional As incorporation in an unknown AsHg8 structure
Biquard X, Alliot I, Ballet P
Journal of Applied Physics 106 (2009) 103501
http://dx.doi.org/10.1063/1.3255989
A hard x-ray nanoprobe for scanning and projection nanotomography
Bleuet P, Cloetens P, Gergaud P, Mariolle D, Chevalier N, Tucoulou R, Susini J, Chabli A
Review of Scientific Instruments 80 (2009) 056101
http://dx.doi.org/10.1063/1.3117489
Sign of the nonlinear dielectric susceptibility of amorphous and crystalline SrTiO3 films
Blonkowski S, Defay E, Biquard X
Physical Review B 79 (2009) 104108
http://dx.doi.org/10.1103/PhysRevB.79.104108
X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs nanowires
Eymery J, Favre-Nicolin V, Froberg L, Samuelson L
Applied Physics Letters 94 (2009) 131911
http://dx.doi.org/10.1063/1.3114369
Coherent-diffraction imaging of single nanowires of diameter 95 nanometers
Favre-Nicolin V, Eymery J, Koester R, Gentile P
Physical Review B 79 (2009) 195401
http://dx.doi.org/10.1103/PhysRevB.79.195401
Adhesion of growing nanoparticles at a glance: Surface differential reflectivity spectroscopy and grazing incidence small angle x-ray scattering
Lazzari R, Renaud G, Revenant C, Jupille J, Borensztein Y
Physical Review B 79 (2009) 125428
http://dx.doi.org/10.1103/PhysRevB.79.125428
Alkoxysilane layers deposited by SC CO2 process on silicon oxide for microelectronics applications
Rebiscoul D, Perrut V, Renault O, Rieutord F, Olivier S, Haumesser PH
Journal of Supercritical Fluids 51 (2009) 287-294
http://dx.doi.org/10.1016/j.supflu.2009.08.008
Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering
Renaud G, Lazzari R, Leroy F
Surface Science Reports 64 (2009) 255-380
http://dx.doi.org/10.1016/j.surfrep.2009.07.002
Defect-pinned nucleation, growth, and dynamic coalescence of Ag islands on MgO(001): An in situ grazing-incidence small-angle x-ray scattering study
Revenant C, Renaud G, Lazzari R, Jupille J
Physical Review B 79 (2009) 235424
http://dx.doi.org/10.1103/PhysRevB.79.235424
Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays
Richard MI, Favre-Nicolin V, Renaud G, Schulli TU, Priester C, Zhong Z, Metzger TH
Applied Physics Letters 94 (2009) 013112
http://dx.doi.org/10.1063/1.3064157
In situ x-ray scattering study on the evolution of Ge island morphology and relaxation for low growth rate: Advanced transition to superdomes
Richard MI, Schulli TU, Renaud G, Wintersberger E, Chen G, Bauer G, Holy V
Physical Review B 80 (2009) 045313
http://dx.doi.org/10.1103/PhysRevB.80.045313
Enhanced Relaxation and Intermixing in Ge Islands Grown on Pit-Patterned Si(001) Substrates
Schulli TU, Vastola G, Richard MI, Malachias A, Renaud G, Uhlik F, Montalenti F, Chen G, Miglio L, Schaffler F, Bauer G
Physical Review Letters 102 (2009) 025502
http://dx.doi.org/10.1103/PhysRevLett.102.025502
Hydrated cholesterol: Phospholipid domains probed by synchrotron radiation
Solomonov I, Daillant J, Fragneto G, Kjaer K, Micha JS, Rieutord F, Leiserowitz L
European Physical Journal E 30 (2009) 215-221
http://dx.doi.org/10.1140/epje/i2009-10498-2
Mechanism of Thermal Silicon Oxide Direct Wafer Bonding
Ventosa C, Morales C, Libralesso L, Fournel F, Papon AM, Lafond D, Moriceau H, Penot JD, Rieutord F
Electrochemical and Solid State Letters 12 (2009) H373-H375
http://dx.doi.org/10.1149/1.3193533
A model of interface defect formation in silicon wafer bonding
Vincent S, Radu I, Landru D, Letertre F, Rieutord F
Applied Physics Letters 94 (2009) 101914
http://dx.doi.org/10.1063/1.3100780