In-situ observation of stress-induced stochastic twin boundary motion in off stoichiometric NiMnGa single crystals
Barabash RI, Kirchlechner C, Robach O, Ulrich O, Micha J-S, Sozinov A and Barabash OM
Applied Physics Letters 103 (2013) 021909
http://dx.doi.org/10.1063/1.4813440
Strains Induced by Point Defects in Graphene on a Metal
Blanc N, Jean F, Krasheninnikov AV, Renaud G and Coraux J
Physical Review Letters 111 (2013) 085501
http://dx.doi.org/10.1103/PhysRevLett.111.085501
Mechanism of Edge Bonding Void Formation in Hydrophilic Direct Wafer Bonding
Castex A, Broekaart M, Rieutord F, Landry K and Lagahe-Blanchard C
ECS Solid State Letters 2 (2013) P47-P50
http://dx.doi.org/10.1149/2.006306ssl
Interface accommodation mechanism for weakly interacting epitaxial systems
Danescu A, Gobaut B, Penuelas J, Grenet G, Favre-Nicolin V, Blanc N, Zhou T, Renaud G and Saint-Girons G
Applied Physics Letters 103 (2013) 021602
http://dx.doi.org/10.1063/1.4813548
Concentration and Strain Fields inside a Ag/Au Core-Shell Nanowire Studied by Coherent X-ray Diffraction
Haag ST, Richard M-I, Welzel U, Favre-Nicolin V, Balmes O, Richter G, Mittemeijer EJ and Thomas O
Nano Letters 13 (2013) 1883-1889
http://dx.doi.org/10.1021/nl303206u
Surface stresses on symmetric (2 x 1) reconstructed Si(001) calculated from surface energy variations
Hecquet P
Surface Science 618 (2013) 83-87
http://dx.doi.org/10.1016/j.susc.2013.08.008
Effect of preparation on the commensurabilities and thermal expansion of graphene on Ir(111) between 10 and 1300 K
Jean F, Zhou T, Blanc N, Felici R, Coraux J and Renaud G
Physical Review B 88 (2013) 165406
http://dx.doi.org/10.1103/PhysRevB.88.165406
An alternative pathway for understanding plasticity at the micrometre scale
Kirchlechner C, Motz C, Imrich PJ, Liegl W, Keckes J, Thomas O, Labat S, Micha JS, Ulrich O and Dehm G
ESRF Highligths 2012 (2013) 116
http://www.esrf.eu/cms/live/live/en/sites/www/home/UsersAndScience/Publications/Highlights/2012/materials/mat16.html
Time-Dependent Relaxation of Strained Silicon-on-Insulator Lines Using a Partially Coherent X-Ray Nanobeam
Mastropietro F, Eymery J, Carbone G, Baudot S, Andrieu F and Favre-Nicolin V
Physical Review Letters 111 (2013) 215502
http://dx.doi.org/10.1103/PhysRevLett.111.215502
Development of microcracks in hydrogen-implanted silicon substrates
Penot J-D, Massy D, Rieutord F, Mazen F, Reboh S, Madeira F, Capello L, Landru D and Kononchuk O
Journal of Applied Physics 114 (2013) 123513
http://dx.doi.org/10.1063/1.4821239
Nanoscale organization by elastic interactions between H and He platelets in Si
Reboh S, Barbot JF, Vallet M, Beaufort MF, Rieutord F, Mazen F, Cherkashin N, Fichtner PFP and Grilhe J
Journal of Applied Physics 114 (2013) 073517
http://dx.doi.org/10.1063/1.4818812
Effect of H-implantation in the local elastic properties of silicon crystals
Reboh S, Rieutord F, Vignoud L, Mazen F, Cherkashin N, Zussy M, Landru D and Deguet C
Applied Physics Letters 103 (2013) 181911
http://dx.doi.org/10.1063/1.4828659
Lattice strain of hydrogen-implanted silicon: Correlation between X-ray scattering analysis and ab-initio simulations
Rieutord F, Mazen F, Reboh S, Penot JD, Bilteanu L, Crocombette JP, Vales V, Holy V and Capello L
Journal of Applied Physics 113 (2013) 153511
http://dx.doi.org/10.1063/1.4800538
A tunable multicolour 'rainbow' filter for improved stress and dislocation density field mapping in polycrystals using X-ray Laue microdiffraction
Robach O, Micha JS, Ulrich O, Geaymond O, Sicardy O, Hartwig J and Rieutord F
Acta Crystallographica Section A 69 (2013) 164-170
http://dx.doi.org/10.1107/s0108767313000172