A new method for polychromatic X-ray mu Laue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device
Abboud A, Kirchlechner C, Send S, Micha JS, Ulrich O, Pashniak N, Strueder L, Keckes J and Pietsch U
Review of Scientific Instruments 85 (2014) 113901
http://dx.doi.org/10.1063/1.4900482
Local band bending and grain-to-grain interaction induced strain nonuniformity in polycrystalline CdTe films
Consonni V, Baier N, Robach O, Cayron C, Donatini F and Feuillet G
Physical Review B 89 (2014) 035310
http://dx.doi.org/10.1103/PhysRevB.89.035310
Integration techniques for surface X-ray diffraction data obtained with a two-dimensional detector
Drnec J, Zhou T, Pintea S, Onderwaater W, Vlieg E, Renaud G and Felici R
Journal of Applied Crystallography 47 (2014) 365-377
http://dx.doi.org/10.1107/S1600576713032342
X-ray mu-Laue diffraction analysis of Cu through-silicon vias: A two-dimensional and three-dimensional study
Ferreira Sanchez D, Laloum D, Weleguela MLD, Ulrich O, Audoit G, Grenier A, Micha J-S, Robach O, Lorut F, Gergaud P, et al.
Journal of Applied Physics 116 (2014) 163509
http://dx.doi.org/10.1063/1.4899318
Growth of Ge islands on SrTiO3 (001) 2 x 1 reconstructed surface: Epitaxial relationship and effect of the temperature
Gobaut B, Penuelas J, Benamrouche A, Robach Y, Blanc N, Favre-Nicolin V, Renaud G, Largeau L and St-Girons G
Surface Science 624 (2014) 130-134
http://dx.doi.org/10.1016/j.susc.2014.02.009
Interaction energy between dipole lines applied on symmetric (2 x 1) reconstructed Si(001)
Hecquet P
Surface Science 624 (2014) 80-88
http://dx.doi.org/10.1016/j.susc.2014.02.001
Investigations of segregation phenomena in highly strained Mn-doped Ge wetting layers and Ge quantum dots embedded in silicon
Prestat E, Porret C, Favre-Nicolin V, Tainoff D, Boukhari M, Bayle-Guillemaud P, Jamet M and Barski A
Applied Physics Letters 104 (2014) 102409
http://dx.doi.org/10.1063/1.4867651
Asymmetric grazing incidence small angle x-ray scattering and anisotropic domain wall motion in obliquely grown nanocrystalline Co films
Quiros C, Peverini L, Diaz J, Alija A, Blanco C, Velez M, Robach O, Ziegler E and Alameda JM
Nanotechnology 25 (2014) 335704
http://dx.doi.org/10.1088/0957-4484/25/33/335704
Interfacial closure of contacting surfaces
Rieutord F, Rauer C and Moriceau H
EPL 107 (2014) 34003
http://dx.doi.org/10.1209/0295-5075/107/34003
Foliar or root exposures to smelter particles: Consequences for lead compartmentalization and speciation in plant leaves
Schreck E, Dappe V, Sarret G, Sobanska S, Nowak D, Nowak J, Stefaniak EA, Magnin V, Ranieri V and Dumat C
Science of the Total Environment 476 (2014) 667-676
http://dx.doi.org/10.1016/j.scitotenv.2013.12.089
High In-content InGaN layers synthesized by plasma-assisted molecular-beam epitaxy: Growth conditions, strain relaxation, and In incorporation kinetics
Valdueza-Felip S, Bellet-Amalric E, Nunez-Cascajero A, Wang Y, Chauvat MP, Ruterana P, Pouget S, Lorenz K, Alves E and Monroy E
Journal of Applied Physics 116 (2014) 233504
http://dx.doi.org/10.1063/1.4903944