ResearchID: H-8137-2014, h-index 40, 225 publications
ScopusID: 7004558167
Current position Deputy Head of
LEMMA Expert in Transmission Electron Microscopy (TEM)
++ pushing one step further some TEM techniques
++ highlighting interesting material structures
Looking for Students, PhD-students and Post-docs
Contact me by mail
Research Interests
PUSHING ONE STEP FURTHER SOME TEM TECHNIQUES • Strain Measurement by using several different TEM techniques:

o High-Resolution Transmission Electron Microscopy (
HR-TEM): development of a Geometrical Phase Analysis software (GEM-GPA)

o Convergent Beam Electron Diffraction (
CBED): use of the stress relaxtion of the TEM lamella to compute the initial strain and stress

o High-Resolution Scanning Transmission Electron Microscopy (
HR-STEM): with Pr. Jim Zuo, development of the Template Matching Analysis (TeMA and
GEM-TeMA)

o NanoBeam Electron Diffraction (
NBED)

o NanoBeam Precession Electron Diffraction (
N-PED): development of a GEM-NPED software, adapted by FEI (now ThermoFisher Scientific) in their epsilon package.

o Scanning Moiré Fringes (
SMF)

o Dark Field Electron Holography (
DFEH): in collaboration with D. Cooper.
• Quantitative Analysis of High Resolution images: initially HR-TEM and now HR-STEM
• Development of Diffraction based techniques:

Coherent Diffractive Imaging (CDI)

and now starting ptychography and looking for students, PhD students and post-docs
MATERIAL STUDIES • III-nitrides: polarity measurements, quantum dots aside dislocations, core-shell inversion domains in nanowires, strain around quantum dots, In segregation
• Si and Ge grain boundaries made either by Czochraski growth or by wafer bounding
• Phase Change Memory (PCM)
• Transistors: enhanced new strain measurements, measuring dopant concentration
• Nanoparticles: structure détermination
Scientific publications • Full list of publications
via Google Scholar.
• List of publications in
ResearchGate.
• List of publications in
ORCID.
Academic Training
Feb. 2001: PhD supervisor Certificate "Electron Microscopy and structures of semiconductors" University Joseph Fourier - Grenoble

Jan. 1989: PhD (University Joseph Fourier - Grenoble), supervisor: Dr A. Bourret, CEA-Grenoble "Atomic structure of <001> tilt grain boundaries in Silicon and Germanium”

June 1986: Master of science (University Joseph Fourier - Grenoble)

July 1985: Engineer of the “Ecole Polytechnique” in Paris (X82)
Personnal Information Born October 14
th 1961 (56 years old) in Bessèges (30) France.
Maried with 4 children.
Studied Piano with a teacher (13 years), Guitar alone (8 years), Violon alone (6 years) and now with a teacher (2 years)
I have many dreams... I like efficiency, simplicity, frankness, harmony.