You are here : Home > The MEM Lab > Jean-Luc Rouvière

Jean-Luc Rouvière

Modeling, Exploration of Materials laboratory (MEM)
Laboratory of Electron Microscopy and Material Advances (LEMMA)
04 38 78 50 86
04 38 78 51 97
ORCID Id: 0000-0001-8731-3074 
ResearchID: H-8137-2014, h-index 40, 225 publications
ScopusID: 7004558167

Current position
Deputy Head of LEMMA
Expert in Transmission Electron Microscopy (TEM)
++ pushing one step further some TEM techniques
++ highlighting interesting material structures

Looking for Students, PhD-students and Post-docs
internship IUT: Implémenter et améliorer un logiciel de simulation d'images de microscopie électronique sur un cluster de calculs
internship Master 2: Développer la ptychographie électronique en utilisant les matériaux 2D
internship IUT (taken already) Testing new ways of preparing samples for Transmission Electron Microscopy observations
PhD: Développer la ptychographie électronique en utilisant les matériaux 2D - Developing electron ptychography by using 2D materials

Research Interests

• Strain Measurement by using several different TEM techniques:
o High-Resolution Transmission Electron Microscopy (HR-TEM): development of a Geometrical Phase Analysis software (GEM-GPA)
o Convergent Beam Electron Diffraction (CBED): use of the stress relaxtion of the TEM lamella to compute the initial strain and stress
o High-Resolution Scanning Transmission Electron Microscopy (HR-STEM): with Pr. Jim Zuo, development of the Template Matching Analysis (TeMA and GEM-TeMA)
o NanoBeam Electron Diffraction (NBED)
o NanoBeam Precession Electron Diffraction (N-PED): development of a GEM-NPED software, adapted by FEI (now ThermoFisher Scientific) in their epsilon package.
o Scanning Moiré Fringes (SMF)
o Dark Field Electron Holography (DFEH): in collaboration with D. Cooper.

• Quantitative Analysis of High Resolution images: initially HR-TEM and now HR-STEM
• Development of Diffraction based techniques:
Coherent Diffractive Imaging (CDI)
and now starting ptychography and looking for students, PhD students and post-docs

• III-nitrides: polarity measurements, quantum dots aside dislocations, core-shell inversion domains in nanowires, strain around quantum dots, In segregation
• Si and Ge grain boundaries made either by Czochraski growth or by wafer bounding
• Phase Change Memory (PCM)
• Transistors: enhanced new strain measurements, measuring dopant concentration
• Nanoparticles: structure détermination

Scientific publications
• Full list of publications via Google Scholar.
• List of publications in ResearchGate.
• List of publications in ORCID.

Academic Training
Feb. 2001: PhD supervisor Certificate "Electron Microscopy and structures of semiconductors" University Joseph Fourier - Grenoble
Jan. 1989: PhD (University Joseph Fourier - Grenoble), supervisor: Dr A. Bourret, CEA-Grenoble "Atomic structure of <001> tilt grain boundaries in Silicon and Germanium”
June 1986: Master of science (University Joseph Fourier - Grenoble)
July 1985: Engineer of the “Ecole Polytechnique” in Paris (X82)

Personnal Information
Born October 14th 1961 (56 years old) in Bessèges (30) France.
Maried with 4 children.
Studied Piano with a teacher (13 years), Guitar alone (8 years), Violon alone (6 years) and now with a teacher (2 years)
I have many dreams... I like efficiency, simplicity, frankness, harmony.

Top page

Top page