Alternate dissociation of the screw dislocations in a (001) buried small-angle twist boundary in silicon
Bonnet R, Loubradou M, Youssef S, Rouviere JL, Fournel F
Philosophical Magazine 89 (2009) 413-434
http://dx.doi.org/10.1080/14786430802651521

Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins
Cayron C, Den Hertog M, Latu-Romain L, Mouchet C, Secouard C, Rouviere JL, Rouviere E, Simonato JP
Journal of Applied Crystallography 42 (2009) 242-252
http://dx.doi.org/10.1107/s0021889808042131

Controlled Switching of Neel Caps in Flux-Closure Magnetic Dots
Cheynis F, Masseboeuf A, Fruchart O, Rougemaille N, Toussaint JC, Belkhou R, Bayle-Guillemaud P, Marty A
Physical Review Letters 102 (2009) 107201
http://dx.doi.org/10.1103/PhysRevLett.102.107201

Quantitative evaluation of process induced strain in MOS transistors by Convergent Beam Electron Diffraction
Clement L, Cacho F, Pantel R, Rouviere JL
Micron 40 (2009) 886-893
http://dx.doi.org/10.1016/j.micron.2009.06.001

Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution
Cooper D, Barnes JP, Hartmann JM, Beche A, Rouviere JL
Applied Physics Letters 95 (2009) 053501
http://dx.doi.org/10.1063/1.3196549

Oscillatory behavior of perpendicular magnetic anisotropy in Pt/Co/Al(O-x) films as a function of Al thickness
Dahmane Y, Arm C, Auffret S, Ebels U, Rodmacq B, Dieny B
Applied Physics Letters 95 (2009) 222514
http://dx.doi.org/10.1063/1.3269932

Mapping Active Dopants in Single Silicon Nanowires Using Off-Axis Electron Holography
Den Hertog MI, Schmid H, Cooper D, Rouviere JL, Bjork MT, Riel H, Rivallin P, Karg S, Riess W
Nano Letters 9 (2009) 3837-3843
http://dx.doi.org/10.1021/nl902024h

Magnetic bubbles in FePd thin films near saturation
Jourdan T, Masseboeuf A, Lancon F, Bayle-Guillemaud P, Marty A
Journal of Applied Physics 106 (2009) 073913
http://dx.doi.org/10.1063/1.3243318

Scanning Transmission Electron Microscopy Investigation of Differences in the High Temperature Redox Deactivation Behavior of CePrOx Particles Supported on Modified Alumina
Lopez-Haro M, Aboussaid K, Gonzalez JC, Hernandez JC, Pintado JM, Blanco G, Calvino JJ, Midgley PA, Bayle-Guillemaud P, Trasobares S
Chemistry of Materials 21 (2009) 1035-1045
http://dx.doi.org/10.1021/cm8029054

The use of Lorentz microscopy for the determination of magnetic reversal mechanism of exchange-biased Co30Fe70/NiMn bilayer
Masseboeuf A, Gatel C, Bayle-Guillemaud P, Lamy Y, Viala B
Journal of Magnetism and Magnetic Materials 321 (2009) 3080-3083
http://dx.doi.org/10.1016/j.jmmm.2009.05.011

Lorentz microscopy mapping for domain wall structure study in L1(0) FePd thin films
Masseboeuf A, Gatel C, Bayle-Guillemaud P, Marty A, Toussaint JC
Ultramicroscopy 110 (2009) 20-25
http://dx.doi.org/10.1016/j.ultramic.2009.08.006

Probing magnetic singularities during magnetization process in FePd films
Masseboeuf A, Jourdan T, Lancon F, Bayle-Guillemaud P, Marty A
Applied Physics Letters 95 (2009) 212501
http://dx.doi.org/10.1063/1.3266825

Quantitative Observation of Magnetic Flux Distribution in New Magnetic Films for Future High Density Recording Media
Masseboeuf A, Marty A, Bayle-Guillemaud P, Gatel C, Snoeck E
Nano Letters 9 (2009) 2803-2806
http://dx.doi.org/10.1021/nl900800q

The evolution of the fraction of Er ions sensitized by Si nanostructures in silicon-rich silicon oxide thin films
Noe P, Okuno H, Jager JB, Delamadeleine E, Demichel O, Rouviere JL, Calvo V, Maurizio C, D'Acapito F
Nanotechnology 20 (2009) 355704
http://dx.doi.org/10.1088/0957-4484/20/35/355704

The morphology of silicon nanowires grown in the presence of trimethylaluminium
Oehler F, Gentile P, Baron T, Den Hertog M, Rouviere J, Ferret P
Nanotechnology 20 (2009) 245602
http://dx.doi.org/10.1088/0957-4484/20/24/245602

High-resolution transmission electron microscopy observations of La2Zr2O7 thin layers on LaAlO3 obtained by chemical methods
Rapenne L, Jimenez C, Caroff T, Millon C, Morlens S, Bayle-Guillemaud P, Weiss F
Journal of Materials Research 24 (2009) 1480-1491
http://dx.doi.org/10.1557/JMR.2009.0162