Field mapping of focused ion beam prepared semiconductor devices by off-axis and dark field electron holography
Cooper D, Rivallin P, Guegan G, Plantier C, Robin E, Guyot F and Constant I
Semiconductor Science and Technology 28 (2013) 125013
http://dx.doi.org/10.1088/0268-1242/28/12/125013

Probing the structure, the composition and the ORR activity of Pt3Co/C nanocrystallites during a 3422 h PEMFC ageing test
Dubau L, Lopez-Haro M, Castanheira L, Durst J, Chatenet M, Bayle-Guillemaud P, Guetaz L, Caque N, Rossinot E and Maillard F
Applied Catalysis B-Environmental 142 (2013) 801-808
http://dx.doi.org/10.1016/j.apcatb.2013.06.011

Growth and micromagnetism of self-assembled epitaxial fcc(111) cobalt dots
Fruchart O, Masseboeuf A, Toussaint JC and Bayle-Guillemaud P
Journal of Physics-Condensed Matter 25 (2013) 496002
http://dx.doi.org/10.1088/0953-8984/25/49/496002

Towards rapid nanoscale measurement of strain in III-nitride heterostructures
Jones E, Cooper D, Rouviere J-L, Beche A, Azize M, Palacios T and Gradecak S
Applied Physics Letters 103 (2013) 231904
http://dx.doi.org/10.1063/1.4838617

Atomic resolution mapping of interfacial intermixing and segregation in InAs/GaSb superlattices: A correlative study
Kim H, Meng Y, Rouviere J-L, Isheim D, Seidman DN and Zuo J-M
Journal of Applied Physics 113 (2013) 103511
http://dx.doi.org/10.1063/1.4794193

Quantitative damage depth profiles in arsenic implanted HgCdTe
Lobre C, Jalabert D, Vickridge I, Briand E, Benzeggouta D, Mollard L, Jouneau PH and Ballet P
Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 313 (2013) 76-80
http://dx.doi.org/10.1016/j.nimb.2013.07.019

Multiscale tomographic analysis of polymer-nanoparticle hybrid materials for solar cells
Lopez-Haro M, Jiu T, Bayle-Guillemaud P, Jouneau P-H and Chandezon F
Nanoscale 5 (2013) 10945-10955
http://dx.doi.org/10.1039/c3nr03202g

Synergistic Effect in Carbon Coated LiFePO4 for High Yield Spontaneous Grafting of Diazonium Salt. Structural Examination at the Grain Agglomerate Scale
Madec L, Robert D, Moreau P, Bayle-Guillemaud P, Guyomard D and Gaubicher J
Journal of the American Chemical Society 135 (2013) 11614-11622
http://dx.doi.org/10.1021/ja405087x

Synthesis of Colloidal Indium Antimonide Nanocrystals Using Stibine
Maurice A, Haro ML, Hyot B and Reiss P
Particle and Particle Systems Characterization 30 (2013) 828-831
http://dx.doi.org/10.1002/ppsc.201300137

Backside medium energy ion scattering study of the lanthanum diffusion in advanced gate stacks for the 32 nm node
Pierre F, Jalabert D, Boujamaa R, Py M, Barnes JP and Bertin F
Microelectronic Engineering 111 (2013) 29-32
http://dx.doi.org/10.1016/j.mee.2013.05.004

Structure and magnetism in strained Ge1-x-ySnxMny films grown on Ge(001) by low temperature molecular beam epitaxy
Prestat E, Barski A, Bellet-Amalric E, Jacquot JF, Morel R, Tainoff D, Jain A, Porret C, Bayle-Guillemaud P and Jamet M
Applied Physics Letters 103 (2013) 012403
http://dx.doi.org/10.1063/1.4813117

Coarsening of Pt nanoparticles on amorphous carbon film
Prestat E, Popescu R, Blank H, Schneider R and Gerthsen D
Surface Science 609 (2013) 195-202
http://dx.doi.org/10.1016/j.susc.2012.12.014

Multiscale Phase Mapping of LiFePO4-Based Electrodes by Transmission Electron Microscopy and Electron Forward Scattering Diffraction
Robert D, Douillard T, Boulineau A, Brunetti G, Nowakowski P, Venet D, Bayle-Guillemaud P and Cayron C
Acs Nano 7 (2013) 10887-10894
http://dx.doi.org/10.1021/nn4043964

Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
Rouviere J-L, Beche A, Martin Y, Denneulin T and Cooper D
Applied Physics Letters 103 (2013) 241913
http://dx.doi.org/10.1063/1.4829154

Atomic structures of Si and Ge ? =13 001 tilt grain boundaries studied by high-resolution electron microscopy and atomistic simulations
Rouviere J-L, Lancon F and Duparc OH
Philosophical Magazine 93 (2013) 1230-1249
http://dx.doi.org/10.1080/14786435.2013.780135

Strain mapping of Si devices with stress memorization processing
Wang YY, Bruley J, van Meer H, Li J, Domenicucci A, Murray CE and Rouviere J-L
Applied Physics Letters 103 (2013) 052104
http://dx.doi.org/10.1063/1.4816743