Zinc(II) modulates specifically amyloid formation and structure in model peptides
Alies B, Pradines V, Llorens-Alliot I, Sayen S, Guillon E, Hureau C, Faller P
Journal of Biological Inorganic Chemistry 16 (2011) 333-340
http://dx.doi.org/10.1007/s00775-010-0729-8
Competition between Polar and Nonpolar Growth of MgO Thin Films on Au(111)
Benedetti S, Nilius N, Torelli P, Renaud G, Freund HJ, Valeri S
Journal of Physical Chemistry C 115 (2011) 23043-23049
http://dx.doi.org/10.1021/jp207901a
Effect of doping on global and local order in crystalline GeTe
Biquard X, Krbal M, Kolobov AV, Fons P, Simpson RE, Hyot B, Andre B, Tominaga J, Uruga T
Applied Physics Letters 98 (2011) 231907
http://dx.doi.org/10.1063/1.3598384
Twins and their boundaries during homoepitaxy on Ir(111)
Bleikamp S, Coraux J, Robach O, Renaud G, Michely T
Physical Review B 83 (2011) 064103
http://dx.doi.org/10.1103/PhysRevB.83.064103
An Overview of Patterned Metal/Dielectric Surface Bonding: Mechanism, Alignment and Characterization
Di Cioccio L, Gueguen P, Taibi R, Landru D, Gaudin G, Chappaz C, Rieutord F, de Crecy F, Radu I, Chapelon LL, Clavelier L
Journal of the Electrochemical Society 158 (2011) P81-P86
http://dx.doi.org/10.1149/1.3577596
Fast computation of scattering maps of nanostructures using graphical processing units
Favre-Nicolin V, Coraux J, Richard MI, Renevier H
Journal of Applied Crystallography 44 (2011) 635-640
http://dx.doi.org/10.1107/S0021889811009009
Three-dimensional high-resolution quantitative microscopy of extended crystals
Godard P, Carbone G, Allain M, Mastropietro F, Chen G, Capello L, Diaz A, Metzger TH, Stangl J, Chamard V
Nature Communications 2 (2011) 568
http://dx.doi.org/10.1038/ncomms1569
Structure and magnetism of Ge3Mn5 clusters
Jain A, Jamet M, Barski A, Devillers T, Yu IS, Porret C, Bayle-Guillemaud P, Favre-Nicolin V, Gambarelli S, Maurel V, Desfonds G, Jacquot JF, Tardif S
Journal of Applied Physics 109 (2011) 013911
http://dx.doi.org/10.1063/1.3531222
Composition and strain of Ge domes on Si(001) close to the dome/susbtrate interface
Katcho NA, Richard MI, Proietti MG, Renevier H, Leclere C, Favre-Nicolin V, Zhang JJ, Bauer G
Epl 93 (2011) 66004
http://dx.doi.org/10.1209/0295-5075/93/66004
Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars
Kirchlechner C, Keckes J, Motz C, Grosinger W, Kapp MW, Micha JS, Ulrich O, Dehm G
Acta Materialia 59 (2011) 5618-5626
http://dx.doi.org/10.1016/j.actamat.2011.05.037
Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction
Kirchlechner C, Kiener D, Motz C, Labat S, Vaxelaire N, Perroud O, Micha JS, Ulrich O, Thomas O, Dehm G, Keckes J
Philosophical Magazine 91 (2011) 1256-1264
http://dx.doi.org/10.1080/14786431003785639
Size and Catalytic Activity of Supported Gold Nanoparticles: An in Operando Study during CO Oxidation
Laoufi I, Saint-Lager MC, Lazzari R, Jupille J, Robach O, Garaudee S, Cabailh G, Dolle P, Cruguel H, Bailly A
Journal of Physical Chemistry C 115 (2011) 4673-4679
http://dx.doi.org/10.1021/jp1110554
Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate
Mastropietro F, Carbone D, Diaz A, Eymery J, Sentenac A, Metzger TH, Chamard V, Favre-Nicolin V
Optics Express 19 (2011) 19223-19232
http://dx.doi.org/10.1115/1.4003759
Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate
Mastropietro F, Carbone D, Diaz A, Eymery J, Sentenac A, Metzger TH, Chamard V, Favre-Nicolin V
Optics Express 19 (2011) 19223-19232
http://dx.doi.org/10.1364/OE.19.019223
H(2)O Diffusion Barriers at Si-Si Direct Bonding Interfaces for Low Temperature Anneals
Moriceau H, Rieutord F, Libralesso L, Ventosa C, Fournel F, Morales C, Mc Cormick T, Chevolleau T, Radu I
Journal of the Electrochemical Society 158 (2011) H919-H923
http://dx.doi.org/10.1149/1.3610228
Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis
Richard MI, Malachias A, Rouviere JL, Yoon TS, Holmstrom E, Xie YH, Favre-Nicolin V, Holy V, Nordlund K, Renaud G, Metzger TH
Physical Review B 84 (2011) 075314
http://dx.doi.org/10.1103/PhysRevB.84.075314
In situ x-ray study of the formation of defects in Ge islands on Si(001)
Richard MI, Schulli TU, Renaud G
Applied Physics Letters 99 (2011) 161906
http://dx.doi.org/10.1063/1.3654153
Full local elastic strain tensor from Laue microdiffraction: simultaneous Laue pattern and spot energy measurement
Robach O, Micha JS, Ulrich O, Gergaud P
Journal of Applied Crystallography 44 (2011) 688-696
http://dx.doi.org/10.1107/S002188981102320X
Evolution of the electronic structure of a Mott system across its phase diagram: X-ray absorption spectroscopy study of (V(1-x)Cr(x))(2)O(3)
Rodolakis F, Rueff JP, Sikora M, Alliot I, Itie JP, Baudelet F, Ravy S, Wzietek P, Hansmann P, Toschi A, Haverkort MW, Sangiovanni G, Held K, Metcalf P, Marsi M
Physical Review B 84 (2011) 245113
http://dx.doi.org/10.1103/PhysRevB.84.245113
Catalytic properties of supported gold nanoparticles: new insights into the size-activity relationship gained from in operando measurements
Saint-Lager MC, Laoufi I, Bailly A, Robach O, Garaudee S, Dolle P
Faraday Discussions 152 (2011) 253-265
http://dx.doi.org/10.1039/c1fd00028d
X-ray in situ observation of semiconductor heteroepitaxy: from surface reconstruction to island growth
Schulli TU
Semiconductor Science and Technology 26 (2011) 064003
http://dx.doi.org/10.1088/0268-1242/26/6/064003
A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility
Ulrich O, Biquard X, Bleuet P, Geaymond O, Gergaud P, Micha JS, Robach O, Rieutord F
Review of Scientific Instruments 82 (2011) 033908
http://dx.doi.org/10.1063/1.3555068
Atomic structure and composition of the 2 x N reconstruction of the Ge wetting layer on Si(001) investigated by surface x-ray diffraction
Zhou T, Renaud G, Revenant C, Issartel J, Schulli TU, Felici R, Malachias A
Physical Review B 83 (2011) 195426
http://dx.doi.org/10.1103/PhysRevB.83.195426