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Inauguration of a new-generation PFIB-SEM

Thursday June 02, 2023 saw the inauguration of a new-generation PFIB-SEM* in the presence of Pascale Bayle-Guillemaud, Head of IRIG​, and Pierre Benech, General Administrator of INP-Grenoble. This device is financed by Grenoble INP - UGA and IRIG.

Published on 2 June 2023
PFIB-SEMs are rare in the university environment, and plasma-technology ones like this new acquisition are even rarer. This equipment consolidates the collaboration on this technique between Grenoble INP - UGA and the CEA. This latest-generation instrument will open up new capabilities for nano-structuring materials, an essential step in the development chain of new materials.

See this highlight in French.

*Plasma Focused Ion Beam - Scanning Electron Microscope: focused ion probe with xenon plasma source (FIB plasma) coupled to a scanning electron microscope equipped with a field emission gun (SEM).

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